PerkinElmer Spectrum BX II and RX I (FT/IR)Spectrophotometer
These rugged PerkinElmer Spectrum BX II and RX I (FT/IR) Spectrophotometer systems easily handle the everyday challenges of routine applications, such as in busy industrial laboratories or academic teaching, routine identification, or researching a new chemical species. Systems feature a single-beam configuration, high intensity black body cavity source, and Michelson-based DynaScan* interferometer.
Choose either the Model BX II for higher performance and controllable, customizable PC-based software, or the Model RX I, a fully stand-alone integrated system that needs no PC control.
Model BX II provides fast throughput, rapid identification processing and quantification of samples, as well as accurate and dependable results. Built-in validation saves time and money. Exhaustive integrity tests are performed at three levels to ensure that it is working correctly, and that the data is both properly collected and accurate. Model also features a temperature-stabilized DTGS detector.
Model RX I is fully integrated and ready to go, with no need for a PC. Its proven technology ensures accurate, reliable results, while its design withstands the toughest laboratory conditions. A spill-resistant spectroscopic and QWERTY keypad sheilds the system from sample damage. Spectra are displayed in color on the external LCD monitor, and can be manipulated from the keypad. The fully-integrated system has a dedicated processor which communicates with current PCs. No PC is required because the software is built into the system, however the system may also be controlled from a PC that is running Spectrum software. Model also features a LiTaO3 detector and unique, industry-standard COMPARE* algorithm for rigorous materials checking.
Spectrum-validated software ensures that commands are always fit for purpose. Data collection parameters and uneditable history files provide audit trails for GLP compliance.
• Wavelength Range: 7800 nm to 350 cm-1 • Bandwidth: >0.8 cm-1